By Peter W. Hawkes
Advances in Imaging and Electron Physics merges long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This sequence good points prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technology and electronic picture processing, electromagnetic wave propagation, electron microscopy, and the computing tools utilized in most of these domains.
- Contributions from best foreign students and experts
- Discusses sizzling subject components and provides present and destiny learn trends
- Invaluable reference and consultant for physicists, engineers and mathematicians
Read or Download Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 PDF
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Additional resources for Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: 162 by Peter W. Hawkes